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Talos F200X G2 – Transmission Electron Microscopy (TEM)

TEM microscope for high resolution TEM and STEM with accurate chemical quantification.

Talos F200X G2 Transmission Electron Microscope

The Thermo Scientific Talos F200X STEM is a scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. The Talos F200X scanning transmission electron microscope allows for the fastest and most precise EDS analysis in all dimensions, along with high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with fast navigation for dynamic microscopy. The Talos F200X scanning transmission electron microscope also features reduced environmental sensitivity; the instrument enclosure moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.

STEM imaging and chemical analysis

The Talos F200X (S)TEM delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X (S)TEM is ideal for advanced research and analysis in academic, government, semiconductor and industrial environments.

The need for large area correlative imaging at high resolution has recently increased as it allows researchers to preserve the context of their observations while also providing statistically robust data. Thermo Scientific Maps Software (enabled by Thermo Scientific Velox Software) automatically acquires an array of images across a sample and stitches them together to create one large final image. Image acquisition can even be performed unattended. The APW (Automated Particle Workflow) pack has all the benefits described in this section and adds unique processing on a dedicated processing PC with Thermo Scientific Avizo2D Software. You can get nanoparticle parameters like size, area, perimeter, shape, factor, contacts, etc., in an automated way. The fully automated and unattended software pack enables you to use the Talos F200X (S)TEM 24/7, get much better statistics and significantly improve the repeatability because operator bias is not present.

Align Genie Automation Software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator.

HRTEM line resolution
  • ≤0.10 nm
STEM resolution
  • ≤0.16 nm (X-FEG)
  • ≤0.14 nm with 100 pA (X-CFEG)
Super-X EDS system
  • 4 SDD symmetric design, windowless, shutter-protected
Electron energy loss spectroscopy (EELS) energy resolution
  • ≤0.8 eV (X-FEG)
  • ≤0.3 eV (X-CFEG
Gun brightness at 200 kV
  • 1.8×109 A /cm2 srad (X-FEG)
  • 2.4×109 A /cm2 srad (X-CFEG)

Available with a wide range of high-resolution field emissions guns (FEG)

Choose high-brightness X-FEG, or ultra-high-brightness Cold Field Emission Gun (X-CFEG). X-CFEG combines the best (S)TEM imaging with the best energy resolution.

Intuitive software

Thermo Scientific Velox Software offers fast and easy acquisition and analysis of multimodal data.

Faster time to chemical composition

Rapid, precise quantitative EDS analysis reveals nanoscale details in 2D and 3D with high cleanliness.

Better image data

High throughput STEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.

Space for more

Add application-specific in situ sample holders for dynamic experiments.

High-quality (S)TEM images and accurate EDS

Acquire high-quality TEM or STEM images with the innovative and intuitive Velox Software user interface. Unique EDS absorption correction in Velox Software enables highly accurate quantification.

Highly repeatable data collection

All daily TEM tunings, such as focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points and rotation center are automated, ensuring you always start from optimum imaging conditions. Experiments can be repeated reproducibly, allowing you to focus on your research rather than on instrument operation.

Increased productivity

Ultra-stable column and remote operation with the SmartCam Camera and constant-power objective lenses for swift mode and high-voltage (HT) switches. Fast and easy switching for multi-user environments.

  • Process control using electron microscopy
  • Quality control and failure analysis
  • Fundamental Materials Research
  • Semiconductor research and development
  • Semiconductor metrology
  • Semiconductor Failure Analysis
  • Semiconductor materials characterization

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

Atomic-Scale EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Electron Energy Loss Spectroscopy (EELS)

Materials science research benefits from high-resolution EELS for a wide range of analytical applications. This includes high-throughput, high signal-to-noise-ratio elemental mapping, as well as probing of oxidation states and surface phonons.

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

TEM Metrology

Advanced and automated TEM metrology routines deliver significantly greater precision than manual methods. This allows users to generate large amounts of statistically relevant data, with sub-angstrom-level specificity, that is free of operator bias.

TEM Imaging and Analysis

Thermo Scientific transmission electron microscopes offer high-resolution imaging and analysis of semiconductor devices, enabling manufacturers to calibrate toolsets, diagnose failure mechanisms, and optimize overall process yields.