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Xradia Versa – X-ray Microscopes

Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.

  • Expanded access, productivity, capability – ZEISS Xradia 630 Versa
  • Wide range of capabilities – ZEISS Xradia 620 Versa
  • Faster submicron imaging – ZEISS Xradia 610 Versa
  • Flexibility and ease of use – ZEISS Xradia 510 Versa

Microscopy Solutions for Materials Science

  • Characterize three-dimensional structure
  • Observe failure mechanisms, degradation phenomena, and internal defects
  • Investigate properties at multiple length scales
  • Quantify microstructural evolution
  • Perform  in situ  and 4D (time dependent) studies to understand the impact of heating, cooling, desiccation, wetting, tension, compression, imbibition, drainage and other simulated environmental studies
  • Understand the 3D structure of fibers as well as pores and pore pathways in paper
  • Observe the propagation of a crack inside your sample

Applications in Life Sciences

  • 3D imaging of biological samples in their natural surroundings
  • Imaging of plant roots still embedded in their original soil without any special sample preparation
  • Imaging of fragile animal models and plants without any sample preparation and sectioning
  • Submicron imaging of solid structures like seeds as a whole

Applications in Electronics & Semiconductor

  • Perform structural and failure analysis for process development, yield improvement and construction analysis of advanced semiconductor packages, including 2.5/3D and fan-out packages
  • Analyze printed circuit boards for reverse engineering and hardware security
  • Non-destructively image across length scales from module to package to interconnect for submicron-resolution characterization of defects at speeds that can complement physical cross-sectioning
  • Enable better understanding of defect locations and distributions by viewing unlimited virtual cross-section and plan-view images from all desired angles

Microscopy Solutions for Raw Materials

  • Achieve automated mineralogy in 3D with little to no sample prep
  • Perform multiscale pore structure and fluid flow analysis, directly measure fluid flow using in situ flow equipment
  • Perform non-destructive scout scans and cut to ROI for buried structures in metamorphic rocks
  • Analyze grain orientations in steel and other metals

Microscopy Solutions for Additive Manufacturing

  • Detailed shape, size, and volume distribution analysis of particles in Additive Manufacturing (AM) powder bed to determine proper process parameters
  • High-resolution, non-destructive imaging for microstructural analysis of AM parts
  • 3D imaging for comparison with the nominal CAD representation
  • Detection of unmelted particles, high-Z inclusions, and voids
  • Surface roughness analysis of inner structures that cannot be accessed by other methods

Microscopy Solutions for Lithium Ion Batteries

  • Recipe development and supply chain control: inspection of intact samples for effective supplier control, revealing changes in recipe or cost savings that may affect performance or longevity
  • Safety and quality inspection: Identification of debris, particle formation, burrs at the electrical contact or damage to the polymer separator
  • Lifetime and aging effect: Longitudinal studies of aging effects

ZEISS Xradia 630 Versa, with higher energy capabilities of the exclusive 40X Prime objective, enables you to push the limits of submicron imaging like never before. The system achieves unparalleled resolution performance of 450-500 nm across the full range of energy, from 30 kV to 160 kV, unlocking entirely new capabilities for your research. NavX guides users through automated workflows with intelligent system insights to deliver results easily and efficiently. AI-based DeepScout changes the game for understanding your sample with throughput boosts 100 times faster.


Achieve New Degrees of Freedom

With more X-ray photons available on ZEISS Xradia 600-series Versa, you can now achieve even faster time to results for varied sample sizes without compromising resolution. Xradia 620 Versa offers additional unique features and imaging capabilities.

  • Improve scan speed and accuracy of large or irregular samples with advanced acquisition techniques such as High Aspect Ratio Tomography (HART)
  • Automated Filter Changer (AFC) enables seamless filter changing without manual intervention, and your selection can be programmed and recorded for each recipe
  • Unlock crystallographic information in your own lab with the optional LabDCT

Gain an Edge in Contrast

Dual Scan Contrast Visualizer (DSCoVer), exclusive to Xradia 620 Versa, extends the detail captured in a single energy absorption image by combining information from tomographies taken at two different X-ray energies. DSCoVer takes advantage of how X-rays interact with matter based on effective atomic number and density. This provides you with a unique capability for distinguishing, for example, mineralogical differences within rocks as well as among difficult-to-discern materials such as silicon and aluminum.

Investment Protection

As your imaging needs evolve, so should your instrument. Unlike traditional microCT systems, the ZEISS Xradia Versa family is built on an established ZEISS 3D X-ray microscope platform that is upgradeable, expandable and reliable, paving the way for future enhancements and protecting your investment. Select the system that is right for you today and expand as your needs require.

  • Protect your investment by upgrading your system at any time with the latest capabilities and innovations
  • Constant development means that you can add advanced capabilities such as in situ sample environments, unique imaging modalities, and productivity enhancing modules
  • Field conversion from basic systems up to most advanced systems in most instances

Highest Resolution without Compromise

ZEISS Xradia Versa use a two-stage magnification architecture to enable submicron resolution imaging at large working distances—RaaD—for a diverse set of sample sizes and types. With more X-ray photons available, the ZEISS Xradia 600 Series Versa provide faster time to results for the widest range of sample sizes and types, without compromising resolution.

  • Deliver image quality without compromising throughput
  • Image larger, denser objects including intact components and devices, in 3D
  • ZEISS Xradia 600-series Versa obtain true spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm

Higher X-ray Flux

ZEISS Xradia 600 Series Versa leverage 25 W X-ray sealed source technology, delivering high X-ray flux that pushes the boundaries of performance. It provides excellent thermal management, with increased flux capacity and high throughput while maintaining stringent world-class Versa spot size performance. An innovative source control system ensures source responsiveness, enabling a faster scan setup for an easy and engaging user experience

  • Faster tomography scans—up to 2X higher output—enable more sample runs and more regions of interest to explore
  • Higher flux offers higher contrast-to-noise ratio and exceptional performance at high energy (kV), without compromising resolution
  • Sealed sources mean higher vacuum and longer filament life

Premier In Situ and 4D

ZEISS Xradia 600 Series Versa can non-destructively characterize the 3D microstructure of materials under controlled variations (in situ) and enable you to observe the evolution of structures over time (4D). By leveraging RaaD, Xradia Versa XRM maintain the highest resolution across large working distances, accommodating sample, environmental chamber, and high precision in situ load rigs without sacrificing resolution.

  • Characterize and quantify your sample under varying conditions and native-like environments in situ and over time
  • Seamlessly integrate with other ZEISS microscopes to solve multi-scale correlative imaging challenges

A Class Above MicroCT

Extend scientific research beyond the limits of projection-based microCT systems at submicron resolution with ZEISS Xradia 510 Versa XRM. Traditional computed tomography relies on a single stage of geometric magnification and maintaining high resolution for larger samples is impossible due to the longer working distances required. ZEISS Xradia Versa XRM feature a unique two-stage process based on synchrotron caliber optics. Multilength-scale capabilities enable you to image the same sample across a wide range of magnifications. An added benefit: ZEISS Xradia 510 Versa is easy to use by everyone in your busy lab.

  • Reduce dependence on geometric magnification and maintain submicron resolution even at large working distances
  • Experience versatility for wide range of materials, including soft and low Z, with unique contrast solutions that overcome the limitations of traditional computed tomography
  • Characterize the microstructure of materials in their native-like environments in situ and study the evolution of properties over time (4D)

True Spatial Resolution

ZEISS XRM systems are specified on true spatial resolution, the most meaningful measurement of your microscope’s performance. Spatial resolution refers to the minimum separation at which two features can be resolved by an imaging system. You would typically measure it by imaging a standardized resolution target with progressively smaller line-space pairs. Spatial resolution accounts for critical characteristics such as X-ray source spot size, detector resolution, magnification geometry, and vibrational, electrical and thermal stability.

  • 0.7 μm true spatial resolution with a minimum achievable voxel size of 70 nm
  • Energy-tuned detectors enable highest resolution across broad ranges of sample types and densities
  • Source operates across the entire application space (30-160 kV) with a wide range of detectors, eliminating the need for manual hardware reconfigurations

Reveal Hidden Details

Your imaging requires superior contrast capabilities to reveal details necessary to accurately visualize and quantify features. ZEISS Xradia Versa systems deliver flexible, high contrast imaging for even your most challenging materials–low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast.

  • Our comprehensive approach employs proprietary enhanced absorption contrast detectors that provide you with superior contrast by maximizing collection of low energy photons while minimizing collection of contrast-reducing high energy photons
  • Tunable propagation phase contrast measures the refraction of X-ray photons at material transitions to allow you to visualize features displaying little or no contrast during absorption imaging