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Phenom Perception GSR – Desktop Scanning Electron Microscopes

SEM EDX gunshot residue analysis with desktop SEM.

SEM EDX gunshot residue analysis

Gunshot residue (GSR) analysis plays an important role in the determination if a firearm has been used in a crime. Established GSR analysis techniques are based on the use of a scanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, an energy dispersive spectroscopy (EDS) technique is used to identify the elements in that particle.

The Thermo Scientific Phenom Perception GSR Desktop SEM is the only dedicated SEM specifically designed for gunshot residue analysis. Because the system is automated, it enables you to speed up the analysis process. With no need to change your settings each time, you can immediately focus on the task at hand.

A high-brightness CeB6 source is at the heart of the desktop Phenom system. This means that you can be confident it will provide reliable, long-lasting daily use and won’t need to be replaced unexpectedly. The Phenom Perception GSR Desktop SEM makes gunshot residue analysis on-demand, faster, easier and more reliable than ever before. Perfect for every busy lab that wants to save time and floor space.

  • Dedicated gunshot residue solution
  • Only needs a small lab space
  • Stable operation, available 24/7
  • Long lifetime CeB6 source
Sample size
  • Max. 100 mm x 100 mm (up to 30 x 12 mm pin stubs)
  • Max. 40 mm (h)
Software Specifications
  • Compliant with ASTM E1588-17
  • Typically ≥ 98% hit rate on plano artificial GSR sample
  • Supports classification of Pb-free ammunition types
  • Automatic calibrations for reproducible results
Detector types
  • Silicon drift detector (SDD)
  • Thermoelectrically cooled (LN2 free)
Reporting workflow
  • Particle relocation, verification and custom report generation
Imaging module
  • 316(w) x 587(d) x 625(h) mm, 75 kg
Analysis computer
  • Standard workstation including: 24” widescreen monitor
  • 169(w) x 445(d) x 432(h) mm, 11kg
  • Single phase AC 110 – 240 Volt, 50/60 Hz, 300 W (max.)

High throughput, reliable results

Thanks to the fully motorized stage, the Phenom Perception GSR Desktop SEM can handle a scan area of 100 mm x 100 mm. The software uses the internal scan control of the SEM. This enables more accurate beam positioning which especially helps when revisiting the particle in the GSR verification phase. A standard GSR sample holder can hold 30 12mm GSR pin stubs plus the necessary calibration samples.

Fully integrated EDS

The dedicated software package Element Identification (EID) is used to control the fully integrated EDS detector. This EID software is delivered standard as part of the Phenom Perception GSR product.

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.