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Phenom ParticleX Steel – Desktop Scanning Electron Microscopes

Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.

Steel microscopy

Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) data for failure analysis and process improvement. The Thermo Scientific Phenom ParticleX Steel Desktop SEM is a multi-purpose desktop SEM enabling failure analysis and automated characterization of non-metallic inclusions in steel.

Steel inclusion analysis

This versatile solution for high-quality imaging and elemental analysis of steel samples provides the data needed for today’s efficient production of high-value steels. Rapid, easy analysis allows you to quickly respond to customer claims of faults, failures, etc., while the automated steel inclusion analysis provides you insight into the steelmaking process.

Electron optical magnification range
  • 160 – 200,000x
Light optical magnification
  • 3–16x
  • <10 nm
Image resolution options
  • 960×600, 1920×1200, 3840×2400, 7680×4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low – medium – high
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)
Sample size
  • Max. 100×100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm height (optional up to 65 mm)
Sample loading time
  • Light optical <5 s
  • Electron optical <60 s

Small Footprint

The Phenom ParticleX Steel Desktop SEM needs only standard wall power, allowing it to extend the capabilities of analytical labs without infrastructure changes. The integrated EDS enables users to simply click-and-go to work with elemental mapping and line scan, which shows the quantified element distribution in a line plot.

Ease of use

The user interface is based on the proven ease-of-use technology applied in the successful Phenom Desktop SEMs. The interface enables both existing and new customers to quickly become familiar with the system with a minimum of training. The high brightness of the unique CeB6 source aids in capturing high image detail as well as rapid automated analysis of steel inclusions.


While the default classification rules and analysis recipe allow you to quickly get started with steel inclusion analysis, the classification and recipes are fully customizable. This allows you to capture new insights in updated recipes

Steel inclusion analysis software

Building on years of experience in steel inclusion analysis, default classification rules and analysis recipes allow users to quickly capture valuable data.

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.