Filter

Showing all 11 results

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition. SEM deliver high resolution imaging and superior materials contrast.

Scanning Electron Microscopes

Apreo 2 SEM – Scanning Electron Microscope

Scanning Electron Microscopes

Axia ChemiSEM – Scanning Electron Microscope

Scanning Electron Microscopes

Crossbeam – Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)

Scanning Electron Microscopes

EVO Family – Scanning Electron Microscope

Scanning Electron Microscopes

GeminiSEM – Field Emission Scanning Electron Microscopes (FE-SEM)

Scanning Electron Microscopes

MultiSEM – Electron Microscopes

Scanning Electron Microscopes

Prisma E SEM – Scanning Electron Microscope

Scanning Electron Microscopes

Quattro ESEM – Scanning electron microscope

Scanning Electron Microscopes

Sigma Family – Field Emission Scanning Electronic Microscope (FE-SEM)

Scanning Electron Microscopes

Verios 5 XHR SEM – Scanning electron microscope

Scanning Electron Microscopes

Volumescope 2 SEM – Scanning Electron Microscope