TEM sample preparation instrument availability
The Helios 6 HD FIB-SEM maximizes system utilization and reduces operating costs with its new Osprey FIB column. The Osprey FIB column with enhanced automated source and column alignments reduces the need for operator and service technician intervention. Additionally, the new Thermo Scientific EasyLift NanoManipulator extends needle life and reduces needle change time to minimize production interruptions.
TEM sample preparation throughput
The Helios 6 HD FIB-SEM features Thermo Scientific AutoTEM 6 Software, which performs automated alignments and enhances grid management for faster setup. An all-new digital scan engine allows simultaneous SEM imaging and milling, while also providing precise scan rotation and accurate pattern positioning. These hardware and software innovations maximize site-specific sample throughput.
TEM sample quality
Sample success rate and quality are of paramount importance, regardless of the type of sample or the sample complexity. Failure analysis labs are expected to deliver high-quality TEM data from every metrology or defect analysis sample.
The Helios 6 HD FIB-SEM contains a new digital scan engine and FIB-SEM control architecture, which provides manual or semi-automated end-pointing for precise isolation of the feature of interest within the sample. In addition, the new Osprey FIB column provides improved low-kV milling. These features combine to deliver high-quality TEM samples, to help you answer the most challenging analysis questions.
TEM metrology
The Helios 6 HD FIB-SEM generates a high volume of TEM samples in a highly repeatable manner, making it ideally suited for semiconductor TEM reference metrology. The Helios 6 HD FIB-SEM complements the Thermo Scientific Spectra, Talos, and Metrios TEMs, delivering high-efficiency, reliable TEM metrology data.
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