Spot Small Differences
- Expanded measurement range: 10 nm – 3,500 µm
- Laser diffraction plus advanced Polarization Intensity Differential Scattering (PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm
- Provides accurate, reliable detection of multiple particle sizes in a single sample
Easy-To-Use Software
- ADAPT Software features automatic pass/fail check
- Pre-configured methods deliver results with 3 clicks or less
- Simplifies analyzer operation by experts & novice users alike
- 1-click overlay with historical data
- Intuitive user diagnostics keep you informed during sampling
- Simplified method creation for standardized measurements
ADAPT Software enables 21 CFR Part 11
- Customizable security system to meet diverse needs
- Choose from 4 security levels
- High-security configuration supports 21 CFR Part 11
PIDS Technology* for Direct Detection of 10 nm Particles
- 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
- Analyzer measures scattered light from samples over a range of angles
- Differences between horizontally & vertically radiated light for each wavelength yield high-resolution particle size distribution data
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