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Nexsa G2 – X-Ray Photoelectron Spectrometers

X-Ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities.

X-ray photoelectron spectroscopy

The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.

Analyzer type
  • 180°, double-focusing, hemispherical analyzer with 128-channel detector
X-ray source type
  • Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size
  • 10–400 µm (adjustable in 5 µm steps)
Depth profiling
  • EX06 monatomic ion source or MAGCIS dual-mode ion source
Maximum Sample area
  • 60 x 60 mm
Maximum sample thickness
  • 20 mm
Vacuum system
  • Two turbo molecular pumps, with automated titanium sublimation pump and backing pump
Optional accessories
  • UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration

High-performance X-ray source

A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing

Bring sample features into focus with the Nexsa XPS System’s patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.

Insulator analysis

The patented dual-beam flood source couples low-energy ion beams with very low-energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need for charge referencing, making the analysis of the data from insulating samples easy and reliable.

Depth profiling

Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Optional sample holders

Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Digital Control

Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system.

NX sample heater module

Fully software-controlled sample heating option, enabling temperature-dependent studies.

  • Battery Research
  • Metals Research
  • Polymers Research
  • Geological Research
  • Oil and Gas
  • Nanoparticles
  • Forensics
  • Catalysis Research
  • Fibers and Filters
  • 2D Materials
  • Automotive Materials Testing

Multi-technique surface analysis workflow

To meet the need for extensive characterization of surfaces, we have established multi-technique workflows based on using either the Thermo Scientific ESCALAB CXi XPS Microprobe or the Thermo Scientific Nexsa Surface Analysis System. These instruments are designed as multi-technique workstations to provide comprehensive analyses in a timely and efficient manner.

X-Ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.