If magnetic field fluctuations occur, they will adversely affect electron beam application devices such as electron microscopes. The AMC-331 is a system that suppresses magnetic field fluctuations by detecting magnetic field fluctuations with a high-sensitivity magnetic field sensor and using a Helmholtz coil to generate magnetic fields of opposite phases.
Control method: DC representative value control + independent feedback control for each axis
Control range: ± 15 μT (approvable)
Control frequency: Quasi DC ~ 1kHz
Attenuation rate: 40-60 dB
Scanning Electron Microscopes (SEM)
αL4X-911R1 – Active Vibration Isolation Table for Electron Microscope
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
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