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Sigma Family – Field Emission Scanning Electronic Microscope (FE-SEM)

FE-SEM for High-Quality Imaging & Advanced Analytical Microscopy

The ZEISS Sigma family combines field emission scanning electronic microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase productivity.

Choose from a suite of detector options. Enter the world of high-end imaging: Sigma 300 delivers excellence in price and performance while Sigma 500’s best-in-class EDS geometry offers superb analytical performance.

  • Flexible detection for clear images
  • Automate and speed up your workflow
  • Perform advanced analytical microscopy
ZEISS Sigma 300  ZEISS Sigma 500
Electron Source Schottky Thermal Field Emitter Schottky Thermal Field Emitter  
Resolution* at 30 kV (STEM) 1.0 nm 0.8 nm  
Resolution* at 15 kV 1.0 nm 0.8 nm  
Resolution* at 1 kV 1.6 nm 1.3 nm  
Resolution* at 30 kV (VP Mode)  2.0 nm 1.5 nm  
Backscatter Detector (BSD) aBSD / HDBSD aBSD / HDBSD  
Maximum Scan Speed 50 ns/pixel 50 ns/pixel  
Accelerating Voltage 0.02 – 30 kV 0.02 – 30 kV  
Magnification 10× – 1,000,000× 10× – 1,000,000×  
Probe Current 3 pA – 20 nA (100 nA optional) 3 pA – 20 nA (100 nA optional)  
Image Framestore 32 k × 24 k pixels 32 k × 24 k pixels  
Ports 10 14  
EDS Ports 2 (1 dedicated port) 3 (2 dedicated ports)  
*optimum working distance; upon final installation, the resolution is proven in the systems acceptance test at 1 kV and 15 kV in high vacuum
Vacuum Modes
High Vacuum Yes Yes  
Variable Pressure 10-133 Pa 10 – 133 Pa  
Stage Type 5 axis compucentric stage 5 axis eucentric stage  5 axis compucentric stage option
Stage travel X 125 mm 130 mm 125 mm
Stage travel Y 125 mm 130 mm 125 mm
Stage travel Z 50 mm 50 mm 38 mm
Stage travel T -10 to +90 degrees -4 to +70 degrees -10 to +90 degrees
Stage travel R 360° Continuous 360° Continuous 360° Continuous