The NanoWizard® V combines high spatio-temporal resolution with a large scan area, flexible experiment design, and outstanding integration with advanced optical microscope systems. Its automated setup, alignment, and re-adjustment of system parameters opens new possibilities for long-term, self-regulating experiments series.
Automated setup, workflow, and calibration enable long-term, self-regulating experiments and complex routines.
Large Samples – Fast Scanning Over a Large Area
Innovative high-speed scanning on rough surfaces and diverse samples, from polymers to solar cells.
Dynamics – Real-Time Visualization
Captures dynamic processes like crystallization, growth, melting, and domain formation at 400 lines/sec.
Operating Modes
Standard Operating Modes
Now with PeakForce-QI including PeakForce Tapping, QI and PeakForce QNM
Including fast PeakForce Tapping and QI with nested scanner technology
Contact mode with lateral force microscopy (LFM)
Tapping Mode™ with PhaseImaging™
ExperimentPlanner for designing a specific measurement workflow
Static and dynamic force spectroscopy
Advanced Force Mapping
Optional Modes
Advanced spectroscopy modes such as various force clamp modes or ramp designs
Fast scanning option with line rates of up to 200 Hz
QI Advanced mode for quantitative data, perfect for soft samples
ScanAsyst automated gain and setpoint adjustment in PeakForce Tapping and PeakForce-QI
Advanced AC modes such as FM and PM with Q-control & Active Gain Control
Microrheology in CellMech Package
Kelvin Probe Microscopy
MFM and EFM
Conductive AFM
STM
Electrical spectroscopy modes
Piezoresponse Microscopy for high voltages
Electrochemistry & Scanning Electrochemistry with temperature control and optical microscopy
NanoLithography and NanoManipulation
NanoIndentation
Scanning Thermal AFM
FluidFM® solution from Cytosurge
ExperimentControl feature for remote experiment control
DirectOverlay 2 for combined AFM and optical microscopy
Additional XY or Z sample movement stages available with CellHesion®, TAO and HybridStage module
Discover the 5th Generation NanoWizard NanoScience AFM
Nanowizard® V sets a new benchmark in automation while providing a host of new technical capabilities and a degree of comfort second to none.
Latest generation packed with novel innovations
Proven legacy of success through an install base of nearly 1000 JPK/Bruker NanoWizard AFMs across the globe
Supported by dedicated cantilever development for high-resolution imaging, fast scanning, and customized applications
Intuitive V8 software environment
Unmatched ease-of-use
Ideal for multi-user imaging facilities
Perfected Performance and Increased Productivity
The NanoWizard V is an outstanding tool for the nanosciences, uniquely combining technical innovation with performance and user comfort.
Paving the way for new scientific discoveries
Lowest noise scanner and detection system ensure high-resolution data and unrivalled performance
High-speed scanning rates of up to 400 lines/sec
Ideal for real-time investigation of dynamics
Automation for improved productivity and maximized throughput
High-resolution nanomechanical imaging with PeakForce-QI™, PeakForce Tapping®, PeakForce QNM,
and QI
DirectOverlay for AFM in conjunction with advanced optical microscopy
Features the latest ExperimentPlanner and ExperimentControl options
Widest range of accessories for environment control, electrical measurements and more
Superior Performance
Versatile imaging from atomic lattices to large scale samples
Largest range of add-ons
Extended optical viewing field for AFM with tiling feature
Optimized storage of parameters and favorite settings
Intuitive user operation
Standardized batch analysis routines for the generation of statistically relevant datasets
Fully automated cantilever and detector alignment
Capture fast dynamic processes in harsh environments
Follow reactions across multiple time scales, from milliseconds, to seconds and minutes
Comprehensive Nanomechanical Characterization
Bruker continuously strives to improve the nanomechanical characterization capabilities of its AFMs and to provide easy technology solutions for complex scientific endeavors
The NanoWizard V is the ideal solution for quantifying nanomechanical properties and understanding the crucial role they play in structure, morphology, and molecular interactions.
The NanoWizard V pushes the boundaries of science, opening the AFM technology to a wider range of applications and making nanomechanical characterization faster, easier, and more accessible for users of all fields of science.
Unrivalled Capabilities
Fast scanning and ease-of-use combined with topographic and nanomechanical imaging
Characterization of viscoelastic properties using microrheological measurements
Contact resonance for mechanical characterization of stiff samples (>10 GPa)
Intuitive and powerful RampDesigner software
Highly sensitive force control and tip-saving features
True, real-time force curve monitoring
Mechanical mapping combined with electrical sample characterization in a single run
New Chapter in Quantitative Imaging
PeakForce-QI, the symbiosis of PeakForce Tapping and QI mode, delivers unique quantitative nanomechanical imaging capabilities. It combines highest acquisition rates with advanced force control to deliver highest resolution, multi-parametric images. The automated setup, operation, and calibration make it simple to configure and run an experiment, and obtain top-quality images and data quickly and easily, even for non-experts.
Powerful Data Analysis
Easy, reliable batch processing
Flexible creation of topography images at different forces
Zero force (contact point) imaging Image stack output of any channel from batch processing
Automation and Intuitive Operation at Its Best
The NanoWizard V was designed to meet the specific needs of scientists in research and industry today. Innovative hardware and software solutions have led to increased throughput, automated measurement pro-cedures, and batch processing routines that allow scientists to focus on what’s important – their research.
Highest Level of Automation
Automated alignment of laser detection system
Automated cantilever calibration
Automated multi-region imaging using HybridStage or motorized stage
Intuitive scripting of automated experiments with ExperimentPlanner
ExperimentControl for remote monitoring of experiments
Intuitive Operation
Workflow-based software with fundamental ease-of-use features
User management, ideal for multi-user facilities
Integrated software assistance
Single-click optical image calibration
Integrated camera for alignment of laser detection system
Comprehensive data processing routines
Convenient saving of parameters and favorite settings
Unrivalled Flexibility by Design
The renowned tip-scanner technology and modular design of the NanoWizard V NanoScience AFM can be seamlessly integrated with advanced optical techniques.
A wide range of advanced modes and accessories make it the most flexible AFM available on the market today, enabling versatile experimental setups and environmental control.
Comprehensive Range of Add-ons and Accessories
Broad range of temperature control accessories (-120 °C up to +300 °C)
Scanning Thermal Microscopy (SThM)
Magnetic Force Microscopy (MFM)
Nanomanipulation
Friction Force Microscopy
Multimodal imaging
Stretching stages
Various fluid cells
see accessories brochure for more options
High-Resolution Electrical Characterization
Conductive AFM (CAFM)
Kelvin Probe Force Microscopy (KPFM)
Electrostatic Force Microscopy (EFM)
Piezo Force Microscopy (PFM)
Scanning Tunneling Microscopy (STM)
Scanning Electrochemical Microscopy (SECM)
For Complex Experiments, from Polymers to Solar Cells
Optimized environmental control options
Optical accessibility of the sample, e.g., for defined illumination
980 nm detection laser option
Various modes for long-term, unattended experiments
The New Benchmark for Fast Scanning of Large Samples
Representative series of phase images taken in TappingMode on a thin film of Poly(3-hydroxybutyrate-co-3-hydroxyvalerate) (PHB/V). Prior to the measurements, the sample was heated to above the melting temperature and then cooled to below the melting temperature immediately before image acquisition. The images show a growth front of the crystallizing PHB/V passing through the scan area. The time difference between each of the displayed images is 18 seconds. The actual data acquisition was running at 2.5 seconds per frame. Scan size: 600 nm × 600 nm Pixel size: 512 px × 512 px Scan speed: 200 lines/sec Phase range: 20 deg.
The NanoWizard V NanoScience platform delivers fast scanning over a large scan area. The full scan range in all three axes remains available, providing unparalleled scanning speeds and easy switching between sample features, without relocation of the sample or a reduction of imaging speed.
The Fast Scanning option is ideal for the investigation of dynamic processes, delivering the speed and accuracy necessary to study phenomena, such as crystallization, growth, melting, and domain building, in real time.
Innovative Fast Scanning Capabilities in an Automated AFM
Improved productivity and maximized throughput for reliable statistics
Fast z-piezo with high resonance frequency delivers fastest feedback
Adaptive intelligence-based scanning routines enable scanning rates of up to 400 lines/sec
NestedScanner technology provides fast scanning of corrugated samples with a z-range of up to 16.5 µm
Active balancing allows fast scanning over large scan areas
High-Resolution Electrical Characterization
Conductive AFM (CAFM)
Kelvin Probe Force Microscopy (KPFM)
Electrostatic Force Microscopy (EFM)
Piezo Force Microscopy (PFM)
Scanning Tunneling Microscopy (STM)
Scanning Electrochemical Microscopy (SECM)
Stability and Highest Data Accuracy Meets Ease-of-Use
Fast scanning with advanced closed-loop control
Fast z-piezo equipped with capacitive sensor for highest data accuracy
Accurate force control thanks to latest feedback technologies
DirectDrive feature for increased cantilever excitation stability
Batch processing and advanced data analysis routines
Movie creator
NanoWizard NanoScience Data Gallery
Bruker’s BioAFMs allow life science and biophysics researchers to further their investigations in the fields of cell mechanics and adhesion, mechanobiology, cell-cell and cell-surface interactions, cell dynamics, and cell morphology.
VI