NanoWizard NanoOptics – Atomic Force Microscope

The new NanoWizard® NanoOptics head comes with excellent physical and optical access to the sample from top and bottom as well as from front and side, even when the head and condenser are in place. Additionally, it has an integrated port for fiber SNOM applications.

Because stability and reproducibility of the SPM-tip positioning and scanning are vital for applications requiring the collection of single photons over a long time period, the system has been optimized for it. Improved closed-loop control on 5 or 6 axes and highest scanner resonance frequency in z deliver a scanner performance previously not available in a commercial AFM. This ensures highest data quality for imaging and force measurements in air and liquids.

The new Vortis™ Advanced SPM controller delivers cutting edge values for noise levels, data acquisition speed, and maximum versatility. Advanced electronics and software for multiple feedback controls, highest bandwidth and access to all signals combined with the ability to work with user-written scripts are all key elements for successful experiments. Synchronization of AFM and spectrometer data is achieved by a user-friendly software interface.

The NanoWizard® AFM is designed for optimal use in liquid and comes with a vapour barrier, encapsulated piezos and a variety of dedicated liquid cells. The system may also be used in air or controlled gas environments.

Flexibility in the software and the range of accessories make the system ready for any user-defined experiments. The newly developed fiber coupled detection module for sensitive detectors such as APDs and PMTs delivers outstanding results in terms of stray-light suppression.

Tip and sample scanner combination

NanoWizard® head (3 scan axes) and TAO™ sample scanner module (2 or 3 scan axes) on top of an inverted microscope integrated into a Raman spectrometer

Suppression of optical cross talk between AFM and Raman excitation/signal

980nm laser source in the AFM

Blocking and cleaning filters in the AFM head

AFM stability over long time

High performance closed-loop scanners and symmetric design of AFM head and stage

Coverslip based fluid cells with temperature control and fluid exchange for highest stability in combination with oil or water immersion objectives

System integration

Synchronization between AFM tip and sample position, and Raman signal recording in the JPK software

JPKs proven algorithm to find the perfect tip position in the focus of the high-NA objective lens

Flexibility

Large variety of AFM/SPM operation modes

Vortis™ Advanced controller with highest speed and lowest noise with a large number of signal channels accessible with the Signal Access front panel

Easy-to-use and fully featured JPK software for advanced experiments for beginners and experts

Raman Reflector Kit for TERS on opaque samples

Complementary techniques to AFM, such as epi-fluorescence, confocal laser scanning microscopy, TIRF, FRET, FCS, FLIM, FRAP, STORM, PALM, STED, spinning disc, etc., give insight about the behavior or location of particular features.

It is now possible to routinely combine AFM imaging and force measurements with these optical methods on the same sample spot simultaneously.

• Head in 2 versions available
  UV transparency version for top view sample illumination with UV-light
  Fiber port version for fiber SNOM applications
• Highest stability and lowest drift for long term experiments
• Up to 6 axes closed-loop scanning (3 by tip and 3 by sample) with the TAO™ module
• 980nm laser source for cantilever deflection detection prevents cross talk with other wavelengths
• Special filter sets for blocking and cleaning inside
• Also versions for 2-photon microscopy available
• Compatible with most commercially available inverted research microscopes (Zeiss Axiovert and Axio Observer lines, Nikon TE and Ti lines, Olympus IX line and Leica DMI/DMi lines
• Seamless integration with inverted microscopes, Raman spectrometers, photon counting systems
• Optional PI PIFOC® module for independent vertical focus positioning
• Coverslip-based sample holders for air, inert gases, liquid and with electrical sample connection

• Flexible Vortis™ Advanced SPM controller with the largest variety of signal channels and Q-control
• Wide range of operation modes and accessories such as Tuning Fork, STM, Conductive AFM, Fiber SNOM, Raman Reflector Kit and fiber coupled detection module