Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker’s NanoScope® 6 controller and PeakForce Tapping® technology to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Dimension Nexus is both an excellent starter system and a perfect addition to any thriving AFM lab.
Best-in-Class Performance
Enables imaging from atomic to molecular resolution.
Ultimate Versatility and Value
Provides an extensive range of AFM modes.
Programmable Motorized Stage
Enhances productivity for publication-ready results.
X-Y Scan Range
90 μm x 90 μm typical, 85 μm minimum
Z Range
10 μm typical in imaging and force curve modes, 9.5 μm minimum
Sample Size/Holder
150 mm vacuum chuck for samples, ≤150 mm diameter, ≤15 mm thick
Motorized Positioning (XY Stage)
150 mm x 150 mm inspectable area; 6 μm repeatability, bidirectional; programmable for multi-site measurements
Microscope Optics
5 MP digital camera; 180 μm to 1465 μm viewing area; digital zoom and motorized focus
Certification
CE
Provides Core Performance and Value in Every Scan
Nexus consistently generates highly accurate, repeatable, publication-ready results for a wide range of sample types in both research and industry applications.
Ensuring High Performance
Central to this system’s best-in-class capabilities is its unique combination of cutting-edge hardware, software, and accessories, including:
Full suite of PeakForce Tapping modes for highest resolution imaging and quantitative mechanical, electrical and chemical property mapping on the widest range of samples
Latest generation NanoScope 6 controller with lowest noise, highest speeds, and utmost versatility for unrivalled capabilities and ease-of-use
XYZ closed-loop scanner, drift-compensated bridge structure, and integrated granite base for small-sample performance on an open-access, large-sample AFM
Largest selection of dedicated AFM Probes optimized for specific modes and samples
High-resolution topography images of a van der Waals heterostructure showing a moiré superlattice. Images collected in torsional resonance dynamic force microscopy (TR-DFM) with a FESPA probe. Scan sizes 1×1 µm and 200×200 nm (orange box)
Guaranteeing Stability
When imaging over long periods of time, Dimension Nexus exhibits minimal drift and, over long scan lengths, the system shows no scanner artifacts or tip degradation.
Start and end of an array of 360 trenches with an overall scan size of 90×2 µmTrench-to-trench pitch measurements across all 360 trenches, showing near-zero deviation over the entire scan range.
Delivers Outstanding Value and Ease of Use
Nexus provides distinct advantages for researchers with early-stage labs or future plans to expand their AFM research:
The base configuration with programmable stage for high-throughput, multi-site measurements rapidly delivers high-quality data to address standard applications.
Operators of all experience levels can produce reliable results with ease-of-use features, such as streamlined sample/probe setup, ScanAsyst self-optimizing imaging, and advanced data analysis software.
Extensive upgrade options — unique operating modes, reliable environmental control, and powerful software integrations — ensure the system can grow with your research.
Phase image of styrene butadiene block copolymer (SBC), collected in TappingMode with an RTESPA probe. Full scan size is 5000×5000 µm, 2560×2560 px. Inset is a digital zoom showcasing the data density and level of detail retained.
Offers Future Versatility and Customization
In addition to being upgradable, Dimension Nexus is open-access to facilitate experiment customization. There is physically open access to the probe-sample junction, accommodating electrical connection attachments and other custom accessories. The NanoScope 6 controller also provides an open hardware and software platform with front-panel BNC connectors, scripting software options, and easy data import to Python for custom analyses.
Microprobers integrated with Dimension Nexus for electrical characterization of nanodevices.
Powered by the NanoScope 6 AFM Controller
Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.
NanoScope 6 uniquely enables Bruker AFMs to:
Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis;
Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and
Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.
Enables Full Range of Applications
With a 150 mm open-access programmable stage, compatibility with majority of Bruker’s 50+ modes including full PeakForce Tapping capabilities, fluid imaging, environmental control, and more, Nexus delivers affordable AFM excellence for a wide range of applications and experiments, including:
Mapping nanomechanical properties of polymers and composite materials
Characterizing graphene, moiré superlattices, and other 2D materials at the nanoscale
Correlating structural and ferroelectric properties of perovskites in photovoltaics
Conducting in-situ and operando studies of the local electrochemical activity of lithium-ion batteries
Quantifying nanoscale surface roughness of semiconductor thin films and substrates
Manipulating and characterizing the electrical properties of DNA nanowires for nanoelectronic devices
PeakForce quantitative nanomechanics (PeakForce QNM®) can be used to map distribution of components in polymer blends. PS-PMMA-PVC sample courtesy of U. Mons. Scan size 5×5 µm, RTESPA-150 probe.
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